• DocumentCode
    1045506
  • Title

    Reliability: Fallacy or Reality?

  • Author

    Gonzalez, Adriana ; Mahlke, Scott ; Mukherjee, Shubu ; Sendag, Resit ; Chiou, Derek ; Yi, Joshua J.

  • Author_Institution
    Univ. Polytech. de Catalunya, Barcelona
  • Volume
    27
  • Issue
    6
  • fYear
    2007
  • Firstpage
    36
  • Lastpage
    45
  • Abstract
    As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability, following an introduction by the authors debate whether reliability is a legitimate concern for the microarchitect. topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it.
  • Keywords
    integrated circuit reliability; chip architects; chip manufacturers; device reliability; microarchitect; Circuit faults; Costs; Delay; Electrical fault detection; Electromigration; Fault detection; Manufacturing processes; Semiconductor device measurement; Temperature; Voltage; and fault-tolerance; arithmetic and logic structures; control structure reliability; control structures and microprogramming; hardware; memory structures; performance and reliability; reliability; testing;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/MM.2007.107
  • Filename
    4437718