DocumentCode
1045506
Title
Reliability: Fallacy or Reality?
Author
Gonzalez, Adriana ; Mahlke, Scott ; Mukherjee, Shubu ; Sendag, Resit ; Chiou, Derek ; Yi, Joshua J.
Author_Institution
Univ. Polytech. de Catalunya, Barcelona
Volume
27
Issue
6
fYear
2007
Firstpage
36
Lastpage
45
Abstract
As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability, following an introduction by the authors debate whether reliability is a legitimate concern for the microarchitect. topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it.
Keywords
integrated circuit reliability; chip architects; chip manufacturers; device reliability; microarchitect; Circuit faults; Costs; Delay; Electrical fault detection; Electromigration; Fault detection; Manufacturing processes; Semiconductor device measurement; Temperature; Voltage; and fault-tolerance; arithmetic and logic structures; control structure reliability; control structures and microprogramming; hardware; memory structures; performance and reliability; reliability; testing;
fLanguage
English
Journal_Title
Micro, IEEE
Publisher
ieee
ISSN
0272-1732
Type
jour
DOI
10.1109/MM.2007.107
Filename
4437718
Link To Document