DocumentCode
1045544
Title
Investigation of Single-Event Transients in Linear Voltage Regulators
Author
Irom, Farokh ; Miyahira, Tetsuo F. ; Adell, Philippe C. ; Laird, Jamie S. ; Conder, Brandon ; Pouget, Vincent ; Essely, Fabien
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Volume
55
Issue
6
fYear
2008
Firstpage
3352
Lastpage
3359
Abstract
Single-event transients (SETs) from heavy ions and laser beam are investigated for two positive adjustable linear voltage regulators: the RH117 from linear technology and the HS-117RH from Intersil. Both positive and negative going transients are observed. The role of input voltage, load capacitance and supply current on the SET response is discussed.
Keywords
laser beam effects; transient analysis; voltage regulators; HS-117RH; laser beam; linear technology; linear voltage regulators; load capacitance; negative going transients; positive going transient; single-event transient response; Analog integrated circuits; Application specific integrated circuits; Circuit testing; Ion beams; Laboratories; Laser beams; Propulsion; Protons; Regulators; Voltage; Laser; radiation testing; single-event transient; voltage regulator;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2008.2007800
Filename
4723744
Link To Document