DocumentCode
1045594
Title
0.32 mu m gate length InP-channel MODFETs with ft above 90 GHz
Author
Ballegeer, D.G. ; Nummila, K. ; Adesida, I. ; Caneau, Catherine ; Bhat, Ritesh
Author_Institution
Illinois Univ., Urbana, IL, USA
Volume
29
Issue
15
fYear
1993
fDate
7/22/1993 12:00:00 AM
Firstpage
1375
Lastpage
1377
Abstract
The fabrication and characterisation of high performance InAlAs/InP modulation-doped field-effect transistors (MODFETs) with 0.32 mu m gate lengths are reported. Devices have been fabricated on two different delta-doped heterostructures with one having an extra delta-doping plane just below the cap layer. The extra doping resulted in devices with lower source and drain parasitic resistances. Extrinsic DC transconductances gmas high as 805 mS/mm and unity current-gain cutoff frequency ft as high as 92 GHz obtained for these devices at a drain-to-source voltage Vds of 2V are attributed to the low parasitics. Also, the devices exhibited an ft of at least 75 GHz up to a Vds of 4 V.
Keywords
III-V semiconductors; aluminium compounds; high electron mobility transistors; indium compounds; semiconductor doping; solid-state microwave devices; 0.32 micron; 2 to 4 V; 75 to 92 GHz; 805 mS; InAlAs-InP; InP-channel; MODFETs; characterisation; cutoff frequency; delta-doped heterostructures; drain-to-source voltage; fabrication; field-effect transistors; low parasitics; modulation-doped;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19930921
Filename
274863
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