DocumentCode :
1045629
Title :
Anisotropy line broadening and related problems in polycrystalline NiFe2 O4
Author :
Krishnan, Ramanathan
Author_Institution :
Centre National de Recherche Scientifique, 92 Bellevue, France.
Volume :
7
Issue :
1
fYear :
1971
fDate :
3/1/1971 12:00:00 AM
Firstpage :
202
Lastpage :
204
Abstract :
Ferrimagnetic resonance line width in slowly cooled and quenched samples of polycrystalline NiFe2 O4 has been measured in the 
band in the range 4.2 to 373°K. Results confirm that the porosity contribution to the line width is best described by the relation ![\\Delta H_{p} = [K.4 \\pi M/(V/\\upsilon ) + 1)]](/images/tex/8164.gif)
with 
, though this overestimates 
in certain cases. The anisotropy contribution to the line width according to Schlömann is 
, with 
when 
M. But our results show that 
depends upon the sign of K1 . For 
and for 
in range 
Oe. For very low values of 
, deviates very much from 2, and particularly so for 
. The effect of K2 is shown to be negligible. Hence the result is interpreted in terms of an effective anisotropy field which takes into account the magnetoelastic energy as well.
band in the range 4.2 to 373°K. Results confirm that the porosity contribution to the line width is best described by the relation with , though this overestimates in certain cases. The anisotropy contribution to the line width according to Schlömann is , with when M. But our results show that depends upon the sign of K and for in range Oe. For very low values of , deviates very much from 2, and particularly so for . The effect of KKeywords :
Ferromagnetic resonance; Magnetic anisotropy; Nickel ferrites; Anisotropic magnetoresistance; Crystalline materials; Ferrimagnetic materials; Ferrites; Magnetic anisotropy; Magnetic field induced strain; Magnetic materials; Magnetic resonance; Perpendicular magnetic anisotropy; Saturation magnetization;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1971.1067008
Filename :
1067008
Link To Document :
