Monte Carlo Analysis of the Effects of Soft Errors Accumulation in SRAM-Based FPGAs

Single event effects in SRAM-based FPGAs have been widely studied and there is a variety of mitigation techniques that can be used in order to achieve a complete fault tolerance. In this scenario, multiple faults are becoming a concern and new methodologies have to be developed in order to evaluate the effects of fault accumulation. In this paper a new Monte Carlo based methodology is used to evaluate soft errors accumulation in the configuration memory of triple modular redundancy designs implemented in SRAM-based FPGAs. Analytical predictions are confirmed by means of fault injection experiments.