DocumentCode
1045888
Title
Origin of High Total Dose Sensitivity on the OP400 Bipolar Operational Amplifier
Author
Bernard, Muriel F. ; Dusseau, Laurent ; Moindjie, Soilihi ; Bouchet, Thierry
Author_Institution
Astrium GmbH, Munich
Volume
55
Issue
6
fYear
2008
Firstpage
3224
Lastpage
3230
Abstract
The OP400 bipolar operational amplifier is widely used in space applications due to its performance and its low power consumption. However experimental results exhibit high total dose sensitivity. Circuit analysis is used to understand mechanisms at play and to find appropriate worst case test methods and solutions for design application.
Keywords
bipolar integrated circuits; low-power electronics; network analysis; operational amplifiers; OP400 bipolar operational amplifier; circuit analysis; high total dose sensitivity; low power consumption; space applications; Circuit analysis; Circuit testing; Degradation; Differential amplifiers; Energy consumption; Mirrors; Operational amplifiers; Packaging; Synthetic aperture sonar; Terrorism; Bipolar transistor; integrated circuits (ICs); slew-rate; total dose;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2008.2007300
Filename
4723778
Link To Document