Title :
Measuring high-bandwidth signals in CMOS circuits
Author :
Larsson, Peter ; Svensson, Christer
Author_Institution :
Dept. of Phys. & Meas., Linkoping Inst. of Technol., Sweden
Abstract :
Presents a technique to measure details of the shape of high-bandwidth signals in CMOS circuits. This technique allows one to study quantities in the subnanosecond range as, for instance, the rise time of a clock edge or the detailed shape of noise pulses.
Keywords :
CMOS integrated circuits; integrated circuit testing; CMOS circuits; clock edge; high-bandwidth signals; noise pulses; rise time; subnanosecond range;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19931173
