• DocumentCode
    1046013
  • Title

    Reliability analysis of large software systems: defect data modeling

  • Author

    Levendel, Ytzhak

  • Author_Institution
    AT&T Bell Lab., Naperville, IL, USA
  • Volume
    16
  • Issue
    2
  • fYear
    1990
  • fDate
    2/1/1990 12:00:00 AM
  • Firstpage
    141
  • Lastpage
    152
  • Abstract
    The author analyzes and models the software development process, and presents field experience for large distributed systems. Defect removal is shown to be the bottleneck in achieving the appropriate quality level before system deployment in the field. The time to defect detection, the defect repair time and a factor reflecting the introduction of new defects due to imperfect defect repair are some of the constants in the laws governing defect removal. Test coverage is a measure of defect removal effectiveness. A birth-death mathematical model based on these constants is developed and used to model field failure report data. The birth-death model is contrasted with a more classical decreasing exponential model. Both models indicate that defect removal is not a cost-effective way to achieve quality. As a result of the long latency of software defects in a system, defect prevention is suggested to be a far more practical solution to quality than defect removal
  • Keywords
    distributed processing; large-scale systems; program testing; software reliability; birth-death mathematical model; bottleneck; defect data modeling; defect removal; field failure report data; large distributed systems; quality; reliability analysis; software development; Availability; Communication industry; Distributed computing; Mathematical model; Military computing; Programming; Reliability; Software systems; Software testing; Telecommunication computing;
  • fLanguage
    English
  • Journal_Title
    Software Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-5589
  • Type

    jour

  • DOI
    10.1109/32.44378
  • Filename
    44378