Title :
From the Reference SEU Monitor to the Technology Demonstration Module On-Board PROBA-II
Author :
Harboe-Sorensen, R. ; Poivey, C. ; Guerre, F.-X. ; Roseng, A. ; Lochon, F. ; Berger, G. ; Hajdas, W. ; Virtanen, A. ; Kettunen, H. ; Duzellier, S.
Author_Institution :
Eur. Space Agency, Noordwijk
Abstract :
The reference SEU Monitor system designed and presented in 2005 (R. H. SOslashrensen, F.-X. Guerre, and A. Roseng ldquoDesign, testing and calibration of a reference SEU monitor system,rdquo in Proc. RADECS, 2005, pp. B3-1-B3-7) has now been used by many researchers at many radiation test sites and has provided valuable calibration data in support of numerous projects. As some of these findings and results give new insight into improved inter-facility calibrations and provide additional inputs into ongoing SEE research, a few of the more interesting cases are presented. Furthermore the dasiadetector elementpsila, the Atmel AT60142F SRAM, now in a hybrid configuration, will form the key detector element in the Technology Demonstration Module (TDM) to be flown on-board the PROBA-II satellite, to be launched at the beginning of 2009. This flight opportunity extends the Reference SEU Database with both ground and space data, taken on the same device under identical operating conditions. Additionally, the Reference SEU Monitor concept is employed as the basis for the new Reference SEL Monitor system, currently under characterization and preparation for integration on the TDM. Ground SEU/SEL characterization of this latch-up experiment is also presented as well as the basic concept of the TDM, the PROBA-II Radiation Monitor module.
Keywords :
SRAM chips; aerospace instrumentation; artificial satellites; radiation hardening (electronics); Atmel AT60142F SRAM; PROBA-II radiation monitor module; SEU monitor; calibration data; detector element; onboard PROBA-II satellite; radiation test; reference SEL monitor system; single event upset; technology demonstration module; Assembly systems; Calibration; Detectors; Particle beams; Radiation monitoring; Random access memory; Single event upset; Space technology; System testing; Time division multiplexing; Facility calibration; SEE characterization; SEL monitor; SEU monitor; SRAM; radiation experiment; radiation testing; single event effects (SEE); single event latch-up (SEL); single event upset (SEU); test facilities; test sites;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2006896