Title :
The Effects of Hydrogen on the Enhanced Low Dose Rate Sensitivity (ELDRS) of Bipolar Linear Circuits
Author :
Pease, Ronald L. ; Adell, Philippe Claude ; Rax, Bernard G. ; Chen, Xiao Jie ; Barnaby, Hugh J. ; Holbert, Keith E. ; Hjalmarson, Harold P.
Author_Institution :
RLP Res., Los Lunas, NM
Abstract :
It is experimentally demonstrated with test transistors and circuits that hydrogen is correlated with enhanced low dose rate sensitivity (ELDRS) in bipolar linear circuits. These experiments show that the amount of hydrogen determines the total dose response versus dose rate, both the saturation at low dose rate and the transition dose rate between the high and low dose rate responses. The experimental results are supported with modeling calculations using REOS (radiation effects in oxides and semiconductors).
Keywords :
bipolar transistors; hydrogen; integrated circuits; radiation effects; H; bipolar linear circuits; enhanced low dose rate sensitivity; low dose rate responses; pnp transistors; radiation effects in oxides and semiconductors; total dose response; Bipolar transistor circuits; Circuit testing; Degradation; Electronic packaging thermal management; Hydrogen; Ionizing radiation; Linear circuits; Radiation effects; Thermal stresses; Voltage; Dose rate; enhanced low-dose rate sensitivity; hydrogen; interface traps; radiation effects; total ionizing dose; voltage comparator;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2006478
