Title :
The Effects of Low Dose-Rate Ionizing Radiation on the Shapes of Transients in the L>M124 Operational Amplifier
Author :
Buchner, Stephen ; McMorrow, Dale ; Roche, Nicholas ; Dusseau, Laurent ; Pease, Ron L.
Author_Institution :
QSS/PSGS, Seabrook, MD
Abstract :
Shapes of single event transients (SETs) in a linear bipolar circuit (LM124) change with exposure to total ionizing dose (TID) radiation. SETs shape changes are a direct consequence of TID-induced degradation of bipolar transistor gain. A reduction in transistor gain causes a reduction in the drive current of the current sources in the circuit, and it is the lower drive current that most affects the shapes of large amplitude SETs.
Keywords :
bipolar analogue integrated circuits; bipolar transistors; operational amplifiers; LM124 operational amplifier; TID-induced degradation; bipolar transistor gain; linear bipolar circuit; low dose-rate ionizing radiation; single event transients; total ionizing dose radiation; Bipolar transistors; Circuits; Electric variables measurement; Error analysis; Ionizing radiation; Operational amplifiers; Optical pulse generation; Pulse amplifiers; Shape measurement; Voltage; Single event transients; total dose effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2007952
