Title :
Probing With Heavy Ions the SET Sensitivity of Linear Devices
Author :
Duzellier, Sophie ; Inguimbert, Christophe ; Nuns, Thierry ; Bezerra, Francoise ; Dangla, David
Author_Institution :
ONERA-DESP, Toulouse
Abstract :
This paper reports on SET heavy ion data used to estimate the range effects and depth location of sensitive structures of the LM124 operational amplifier. These data are correlated with laser measurements and provide experimental insight into the SET test recommendations and prediction rate methodology.
Keywords :
operational amplifiers; LM124 operational amplifier; SET heavy ion data; Absorption; Data analysis; Ion accelerators; Laboratories; Operational amplifiers; Performance evaluation; Satellites; Testing; Vehicles; Volume measurement; Heavy ion; Single Event Transient (SET); linear devices; range effect; sensitive depth;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2007419
