Title :
Laser Dose-Rate Simulation to Complement LINAC Discrete Device Data
Author :
Nation, S.A. ; Massengill, L.W. ; McMorrow, D. ; Evans, L. ; Straatveit, A.
Author_Institution :
Radiat. Effects Group, Vanderbilt Univ., Nashville, TN
Abstract :
Laser-induced dose-rate measurements prove useful for extending the range of LINAC data for statistical analysis and for model creation and validation. Results suggest the ability to generate LINAC-equivalent data for dose-rate model development with minimal LINAC correlation. Highly reliable and repeatable data can be produced through the use of a dedicated laser test bench.
Keywords :
laser beam applications; linear accelerators; statistical analysis; complement LINAC discrete device data; laser dose-rate simulation; laser test bench; laser-induced dose-rate measurements; linear accelerator; statistical analysis; Circuit simulation; Circuit testing; Cranes; Laser modes; Linear particle accelerator; Optical pulses; Photoconductivity; Pulsed laser deposition; Semiconductor process modeling; X-ray lasers; Discrete devices; dose-rate; laser application;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2006969
