Configuration and Routing Effects on the SET Propagation in Flash-Based FPGAs

Author

Rezgui, Sana ; Wang, J.J. ; Sun, Yinming ; Cronquist, Brian ; McCollum, John

Author_Institution

Actel Corp., Mountain View, CA

Volume

55

Issue

6

fYear

2008

Firstpage

3328

Lastpage

3335

Abstract

New insights on SET propagation in flash-based FPGAs are investigated, with regards to their technology and unique non-volatile architecture. By means of SET fault injection tests, the broadening and the filtering of SET pulse widths were demonstrated and are related to the SET pulse transition and data-path in the studied FPGA design. These basic mechanisms result in a clear dependence of the SET pulse width on the design´s configuration and routing that would favor spontaneous SET filtering in most real life designs.

Keywords

field programmable gate arrays; flash memories; logic design; logic testing; network routing; radiation hardening (electronics); SET fault injection; SET propagation; SET pulse transition; SET pulse width; circuit routing effects; flash-based FPGA design; nonvolatile architecture; radiation testing; single event transients; spontaneous SET filtering mechanism; Combinational circuits; Field programmable gate arrays; Filtering; Nonvolatile memory; Programmable logic arrays; Pulse width modulation inverters; Routing; Space vector pulse width modulation; Sun; Testing; Fault injection; propagation and mitigation; radiation testing; reprogrammable and non-volatile flash-based FPGAs; single event transients (SETs) characterization;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2008.2007726

Filename

4723802