Title :
A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops
Author :
Loveless, T. Daniel ; Massengill, Lloyd W. ; Bhuva, Bharat L. ; Holman, W. Timothy ; Casey, Megan C. ; Reed, Robert A. ; Nation, Sarah A. ; McMorrow, Dale ; Melinger, Joseph S.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN
Abstract :
A voltage-controlled-oscillator (VCO) circuit has been designed for radiation-hardened-by-design (RHBD) single-event transient (SET) mitigation. The RHBD technique, which can be readily implemented in mixed-signal phase-locked loops and delay-locked loops, is shown to substantially improve the single-event performance of the VCO while decreasing the RMS phase jitter due to power supply noise. Additionally, using the probabilistic analysis technique presented, the RHBD VCO shows a maximally improved SET response over that of the conventional VCO, decreasing the output phase displacement to below the nominal phase jitter.
Keywords :
delay lock loops; integrated circuit design; jitter; mixed analogue-digital integrated circuits; phase locked loops; probability; radiation hardening (electronics); voltage-controlled oscillators; RHBD VCO design; RMS phase jitter; SET response; delay-locked loops; mixed-signal phase-locked loops; power supply noise; probabilistic analysis technique; radiation-hardened-by-design; single-event transient mitigation; voltage-controlled oscillator; Circuit noise; Circuit topology; Frequency; Jitter; Phase locked loops; Phase noise; Radiation hardening; Semiconductor materials; Transient analysis; Voltage-controlled oscillators; Delay-locked loops; phase-locked loops; radiation effects; radiation hardening; single-event transients; voltage-controlled oscillators;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2005677
