• DocumentCode
    1046173
  • Title

    A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops

  • Author

    Loveless, T. Daniel ; Massengill, Lloyd W. ; Bhuva, Bharat L. ; Holman, W. Timothy ; Casey, Megan C. ; Reed, Robert A. ; Nation, Sarah A. ; McMorrow, Dale ; Melinger, Joseph S.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN
  • Volume
    55
  • Issue
    6
  • fYear
    2008
  • Firstpage
    3447
  • Lastpage
    3455
  • Abstract
    A voltage-controlled-oscillator (VCO) circuit has been designed for radiation-hardened-by-design (RHBD) single-event transient (SET) mitigation. The RHBD technique, which can be readily implemented in mixed-signal phase-locked loops and delay-locked loops, is shown to substantially improve the single-event performance of the VCO while decreasing the RMS phase jitter due to power supply noise. Additionally, using the probabilistic analysis technique presented, the RHBD VCO shows a maximally improved SET response over that of the conventional VCO, decreasing the output phase displacement to below the nominal phase jitter.
  • Keywords
    delay lock loops; integrated circuit design; jitter; mixed analogue-digital integrated circuits; phase locked loops; probability; radiation hardening (electronics); voltage-controlled oscillators; RHBD VCO design; RMS phase jitter; SET response; delay-locked loops; mixed-signal phase-locked loops; power supply noise; probabilistic analysis technique; radiation-hardened-by-design; single-event transient mitigation; voltage-controlled oscillator; Circuit noise; Circuit topology; Frequency; Jitter; Phase locked loops; Phase noise; Radiation hardening; Semiconductor materials; Transient analysis; Voltage-controlled oscillators; Delay-locked loops; phase-locked loops; radiation effects; radiation hardening; single-event transients; voltage-controlled oscillators;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.2005677
  • Filename
    4723804