• DocumentCode
    1046196
  • Title

    Effect of pad and interconnection parasitics on phase delay of transconductance in advanced bipolar transistors

  • Author

    Lee, Sang-Rim ; Ryum, B.R. ; Kwon, O.-J. ; Lee, Joun-Ho

  • Author_Institution
    Dept. of Adv. Devices, Electron. & Telecommun. Res. Inst., Daejeon, South Korea
  • Volume
    29
  • Issue
    20
  • fYear
    1993
  • Firstpage
    1797
  • Lastpage
    1799
  • Abstract
    An analytical expression is developed for determining the accurate phase delay of transconductance or current gain in a small-signal equivalent circuit, including RF probe pad and interconnection parasitics and HBT extrinsic elements. Using this new expression, it is demonstrated that collector resistance, collector interconnection resistance, and pad capacitances have a significant influence on the phase delay.
  • Keywords
    capacitance; delays; electric resistance; equivalent circuits; heterojunction bipolar transistors; semiconductor device models; solid-state microwave devices; HBT; RF probe pad; Y-parameters; Z-parameters; bipolar transistors; collector interconnection resistance; collector resistance; current gain; interconnection parasitics; pad capacitances; pad parasitics; phase delay; small-signal equivalent circuit; transconductance;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19931196
  • Filename
    274924