Title :
Memory characteristics of 2.2-mil plated-wire memory
Author :
Chen, Arthur C M ; Barber, William D. ; Luborsky, Fred E.
Author_Institution :
General Electric Research and Development Center, Schenectady, N.Y.
fDate :
9/1/1971 12:00:00 AM
Abstract :
To obtain lower drive requirements and higher densities, plated-wire memory must use thinner films on smaller diameter substrate. The memory element characteristics of thin (1000-3000 Å) Permalloy film on 2.2-mil tungsten wire substrate are reported here. Nondestructive readout as well as destructive read-out properties and the effect of a simple keeper structure will be described. The determination of a valid test program in terms of pulse aud Belsen tests will also be discussed.
Keywords :
NDRO memories; Plated-wire memories; Analytical models; Geometry; Magnetic films; Packaging; Solid modeling; Substrates; Testing; Transistors; Tungsten; Wire;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1971.1067070