Title :
A 128-Channel CMOS Charge Readout ASIC for Flat-Panel X-Ray Detectors
Author :
Adachi, Susumu ; Nishimura, Akihiro ; Yoshimuta, Toshinori ; Tanabe, Koichi ; Okamura, Shoichi
Author_Institution :
Technol. Res. Lab., Shimadzu Corp., Seika
Abstract :
A CMOS charge readout ASIC (SD7110) for flat-panel X-ray detectors was designed and tested. This ASIC contains 128 readout channels, with each channel consisting of a charge sensitive amplifier, a correlated double sampler, and a track-and-hold circuit. Channel outputs are read out via a 128:1 analog multiplexer and fed into an external 16-bit A/D converter. Conversion gain can be selected from 0.25 V/pC to 8 V/pC. The ASIC operates using a +5.0 V single power supply, with power dissipation of 1.8 mW/channel. The equivalent noise charge (ENC) measured was 400 + 18.9 e-/pF.
Keywords :
CMOS analogue integrated circuits; X-ray detection; amplifiers; analogue-digital conversion; application specific integrated circuits; multiplexing equipment; power supply circuits; readout electronics; 128-channel CMOS charge readout; ASIC; ENC; analog multiplexer; charge sensitive amplifier; correlated double sampler; equivalent noise charge; external 16-bit A/D converter; flat-panel X-ray detectors; power dissipation; single power supply; voltage 5.0 V; Application specific integrated circuits; CMOS analog integrated circuits; CMOS technology; Integrated circuit noise; Multiplexing; Noise measurement; Optical imaging; Sensor arrays; X-ray detectors; X-ray imaging; Application specific integrated circuits; CMOS analog integrated circuits; noise measurement; x-ray detectors; x-ray imaging;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2005105
