Title :
Correction to "Thermal Sensitivity Analysis for the 119 PBGA-A Framework for Rapid Prototyping"
Author :
Mulgaonker, S. ; Berg, H.M.
fDate :
6/1/1996 12:00:00 AM
Keywords :
Conductivity measurement; Conductors; Ferroelectric films; Nonvolatile memory; Prototypes; Random access memory; Semiconductor device packaging; Sensitivity analysis; Substrates; Thermal conductivity;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
DOI :
10.1109/TCPMA.1996.506116
