• DocumentCode
    1046847
  • Title

    Fault-Tolerant Semiconductor Memories

  • Author

    Sarrazin, David B. ; Malek, Miroslaw

  • Author_Institution
    University of Texas at Austin
  • Volume
    17
  • Issue
    8
  • fYear
    1984
  • Firstpage
    49
  • Lastpage
    56
  • Keywords
    Circuit faults; Circuit testing; Computer aided manufacturing; Computer errors; Fault tolerance; Logic testing; Power semiconductor switches; Power supplies; Random access memory; Read-write memory;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.1984.1659217
  • Filename
    1659217
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1046847