Title :
Fault-Tolerant Semiconductor Memories
Author :
Sarrazin, David B. ; Malek, Miroslaw
Author_Institution :
University of Texas at Austin
Keywords :
Circuit faults; Circuit testing; Computer aided manufacturing; Computer errors; Fault tolerance; Logic testing; Power semiconductor switches; Power supplies; Random access memory; Read-write memory;
DOI :
10.1109/MC.1984.1659217
