• DocumentCode
    1046928
  • Title

    Flexible Bragg Reflection Waveguide Devices Fabricated by Post-Lift-Off Process

  • Author

    Kim, Kyung-Jo ; Oh, Min-Cheol

  • Author_Institution
    Pusan Nat. Univ., Pusan
  • Volume
    20
  • Issue
    4
  • fYear
    2008
  • Firstpage
    288
  • Lastpage
    290
  • Abstract
    Bragg reflection waveguide devices are fabricated on a flexible substrate by using a post-lift-off process in order to obtain highly uniform grating patterns on a wide range. In this process, the flexible substrate formed by spin-coating on a silicon wafer is lifted-off at the end of fabrication procedures. The flexible Bragg reflector exhibits very sharp transmission spectrum with a 3-dB bandwidth of 0.1 nm and a 10-dB bandwidth of 0.4 nm, which is provided by the grating pattern with excellent uniformity. Athermal operation of the flexible Bragg reflector is also demonstrated through the optimization of thermal expansion property of the plastic substrate by controlling the thickness of two polymer substrate materials. The flexible substrate made of 0.7-mum SU-8 layers sandwiching 100-mum NOA61 film provides an optimized thermal expansion property compensating the thermooptic effect of the polymer waveguide. The temperature dependence of the Bragg reflector is reduced to -0.011 nm/degC by the plastic substrate.
  • Keywords
    Bragg gratings; optical fabrication; optical polymers; optical waveguides; spin coating; thermal expansion; thermo-optical effects; Bragg reflector; SU-8 layers; flexible Bragg reflection waveguide devices; polymer waveguide; post-lift-off process; spin coating; thermal expansion; thermooptic effect; uniform grating patterns; Bandwidth; Bragg gratings; Fabrication; Plastics; Polymer films; Reflection; Silicon; Substrates; Thermal expansion; Thickness control; Bragg reflector; flexible substrate; polymeric optical waveguide; thermooptic effect; wavelength filter;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2007.915582
  • Filename
    4439740