Title :
F. M. Noise measurements on silicon IMPATT oscillators
Author :
Swartz, G.A. ; Chiang, Y.S. ; Wen, Cheng P. ; Gonzales, A.
fDate :
12/1/1973 12:00:00 AM
Keywords :
Density measurement; Diodes; Electrical resistance measurement; Noise measurement; Noise reduction; Oscillators; Performance analysis; Signal to noise ratio; Silicon; Testing;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1973.17849
