Title :
GaAs carrier wave growth in the presence of a thin resistive surface layer
Author :
Metz, L.S. ; Gandhi, O.P.
Author_Institution :
Unversity of Utah, Salt Lake City, Utah
fDate :
1/1/1974 12:00:00 AM
Abstract :
Thin sheets of resistive material deposited on epitaxial GaAs in order to provide uniform electric field profiles are predicted to still allow microwave gain while suppressing instabilities at all lower frequencies. The gain threshold frequency depends upon the device thickness, the surface resistance of the resistive layer, etc. The mode exhibits a higher cutoff frequency beyond which the gain is not possible because of the severe diffusion losses. Broad-band gain is predicted in the 10-20 GHz range.
Keywords :
Boundary conditions; Electron mobility; Epitaxial layers; Gallium arsenide; Geometry; Microwave devices; Radio frequency; Sheet materials; Surface resistance; Surface waves;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1974.17871