DocumentCode :
1047193
Title :
GaAs carrier wave growth in the presence of a thin resistive surface layer
Author :
Metz, L.S. ; Gandhi, O.P.
Author_Institution :
Unversity of Utah, Salt Lake City, Utah
Volume :
21
Issue :
1
fYear :
1974
fDate :
1/1/1974 12:00:00 AM
Firstpage :
118
Lastpage :
119
Abstract :
Thin sheets of resistive material deposited on epitaxial GaAs in order to provide uniform electric field profiles are predicted to still allow microwave gain while suppressing instabilities at all lower frequencies. The gain threshold frequency depends upon the device thickness, the surface resistance of the resistive layer, etc. The mode exhibits a higher cutoff frequency beyond which the gain is not possible because of the severe diffusion losses. Broad-band gain is predicted in the 10-20 GHz range.
Keywords :
Boundary conditions; Electron mobility; Epitaxial layers; Gallium arsenide; Geometry; Microwave devices; Radio frequency; Sheet materials; Surface resistance; Surface waves;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1974.17871
Filename :
1477686
Link To Document :
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