• DocumentCode
    1047315
  • Title

    Scanning limitations of liquid-crystal displays

  • Author

    Alt, Paul M. ; Pleshko, Peter

  • Author_Institution
    IBM Thomas J. Watson Research Center, Yorktown Heights, N. Y.
  • Volume
    21
  • Issue
    2
  • fYear
    1974
  • fDate
    2/1/1974 12:00:00 AM
  • Firstpage
    146
  • Lastpage
    155
  • Abstract
    The scanning limitations of rms-responding liquid-crystal devices as influenced by device characteristics, the type of matrix addressing scheme, and waveform tolerances are quantified in this paper. An rms selection scheme that yields a greater number of scanned lines than a 3:1 selection scheme is presented and analyzed, together with a two-frequency addressing scheme that overcomes limitations on scanning associated with the cutoff frequency for dynamic-scattering, Dynamic-scattering liquid-crystal displays are the main emphasis of this paper. However, many of the results apply to field-effect liquid-crystal displays.
  • Keywords
    Costs; Cutoff frequency; Liquid crystal displays; Optical devices; Optical scattering; Pulse measurements; Qualifications; Scattering parameters; Threshold voltage; Voltage fluctuations;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1974.17884
  • Filename
    1477699