Title :
Scanning limitations of liquid-crystal displays
Author :
Alt, Paul M. ; Pleshko, Peter
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, N. Y.
fDate :
2/1/1974 12:00:00 AM
Abstract :
The scanning limitations of rms-responding liquid-crystal devices as influenced by device characteristics, the type of matrix addressing scheme, and waveform tolerances are quantified in this paper. An rms selection scheme that yields a greater number of scanned lines than a 3:1 selection scheme is presented and analyzed, together with a two-frequency addressing scheme that overcomes limitations on scanning associated with the cutoff frequency for dynamic-scattering, Dynamic-scattering liquid-crystal displays are the main emphasis of this paper. However, many of the results apply to field-effect liquid-crystal displays.
Keywords :
Costs; Cutoff frequency; Liquid crystal displays; Optical devices; Optical scattering; Pulse measurements; Qualifications; Scattering parameters; Threshold voltage; Voltage fluctuations;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1974.17884