• DocumentCode
    1047347
  • Title

    A new aperture admittance model for open-ended waveguides

  • Author

    Stuchly, S.S. ; Sibbald, C.L. ; Anderson, J.M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Victoria Univ., BC, Canada
  • Volume
    42
  • Issue
    2
  • fYear
    1994
  • fDate
    2/1/1994 12:00:00 AM
  • Firstpage
    192
  • Lastpage
    198
  • Abstract
    A new model for the aperture admittance of open-ended waveguide structures radiating into a homogeneous, lossy dielectric is presented. The model is based on the physical and mathematical properties of the driving point admittance of passive, stable one-port networks. The model parameters, which depend upon the geometry of the waveguide and aperture, are determined from a relatively small number of computed admittances. This computed data is obtained by a full-wave moment method solution and, hence, includes the effects of radiation and energy storage in the near field and the evanescent waveguide modes. The accuracy of the numerical method is demonstrated by comparison with measured values. As an example, the model parameters are determined for the coaxial-line geometry. The accuracy of the model, for both the direct and inverse problem, is verified and a rigorous sensitivity and uncertainty analysis is performed. The new model has important applications in the field of dielectric spectroscopy
  • Keywords
    electric admittance; microwave spectroscopy; waveguide theory; aperture admittance model; coaxial-line geometry; computed admittances; dielectric spectroscopy; driving point admittance; energy storage; evanescent waveguide modes; full-wave moment method solution; geometry; lossy dielectric; model parameters; open-ended waveguides; stable one-port networks; uncertainty analysis; Admittance; Apertures; Computational geometry; Dielectric losses; Dielectric measurements; Energy storage; Mathematical model; Moment methods; Near-field radiation pattern; Solid modeling;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.275246
  • Filename
    275246