DocumentCode
1047651
Title
Special Spark-Gap Switches For Use in Synthetic Test Circuits
Author
Ellis, N.S. ; Lugton, W.T. ; Powell, C.W. ; Ryan, H.M.
Author_Institution
A. Reyrolle & Company Limited
Issue
5
fYear
1972
Firstpage
2020
Lastpage
2025
Abstract
In technology concerned with proving the performance of modern high-power circuit-breakers, special spark-gap switches have been developed to meet the specific requirements of ´break´ and ´make-break´ synthetic circuits, the former operating up to equivalent three. phase test levels of 30 G.V.A. This paper describes the design, performance, characteristics and operating experiences for two types of specialised triggered switches incorporated in the Synthetic test circuits of the Reyrolle Short-Circuit Testing Station.
Keywords
Breakdown voltage; Capacitors; Circuit testing; Electrodes; Low voltage; Plasma sources; Spark gaps; Switches; Switching circuits; Timing;
fLanguage
English
Journal_Title
Power Apparatus and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0018-9510
Type
jour
DOI
10.1109/TPAS.1972.293532
Filename
4074955
Link To Document