Title :
Image processing, a new diagnostic tool
Author :
Poitier, Amy ; Marusa, Walter J., Jr.
Author_Institution :
Kelly AFB, TX, USA
fDate :
3/1/1994 12:00:00 AM
Abstract :
The San Antonio Air Logistics Center (SA-ALC) Automatic Test Systems Division´s Advanced Diagnostics and Technology Insertion Center (ADTIC) is exploring the addition of a non-intrusive diagnostics capability to existing Automatic Test Systems (ATS) utilizing various sensor technologies. The diagnostic techniques under development are expected to allow for more efficient fault detection and isolation than traditional ATS. This paper summarizes findings to date and discusses the integration of these technologies should they prove viable.<>
Keywords :
X-ray applications; aircraft instrumentation; automatic test equipment; fault location; image processing; infrared imaging; military systems; printed circuit testing; printed circuits; CCA; San Antonio Air Logistics Center; X-ray imaging; automatic test systems; circuit card assemblies; diagnostic techniques; fault detection; fault isolation; image processing; non-intrusive diagnostics; sensor technologies; thermal imaging; Automatic testing; Circuit faults; Circuit testing; Costs; Fault detection; Image processing; Isolation technology; Logistics; Optical imaging; System testing;
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
