Image processing, a new diagnostic tool

Author

Poitier, Amy ; Marusa, Walter J., Jr.

Author_Institution

Kelly AFB, TX, USA

Volume

9

Issue

3

fYear

1994

fDate

3/1/1994 12:00:00 AM

Firstpage

34

Lastpage

37

Abstract

The San Antonio Air Logistics Center (SA-ALC) Automatic Test Systems Division´s Advanced Diagnostics and Technology Insertion Center (ADTIC) is exploring the addition of a non-intrusive diagnostics capability to existing Automatic Test Systems (ATS) utilizing various sensor technologies. The diagnostic techniques under development are expected to allow for more efficient fault detection and isolation than traditional ATS. This paper summarizes findings to date and discusses the integration of these technologies should they prove viable.<>

Keywords

X-ray applications; aircraft instrumentation; automatic test equipment; fault location; image processing; infrared imaging; military systems; printed circuit testing; printed circuits; CCA; San Antonio Air Logistics Center; X-ray imaging; automatic test systems; circuit card assemblies; diagnostic techniques; fault detection; fault isolation; image processing; non-intrusive diagnostics; sensor technologies; thermal imaging; Automatic testing; Circuit faults; Circuit testing; Costs; Fault detection; Image processing; Isolation technology; Logistics; Optical imaging; System testing;

fLanguage

English

Journal_Title

Aerospace and Electronic Systems Magazine, IEEE

Publisher

ieee

ISSN

0885-8985

Type

jour

DOI

10.1109/62.275380

Filename

275380