• DocumentCode
    1048262
  • Title

    Atmos—An electrically reprogrammable read-only memory device

  • Author

    Verwey, Jan F. ; Kramer, Roel P.

  • Author_Institution
    Philips Research Laboratories, Eindhoven, The Netherlands
  • Volume
    21
  • Issue
    10
  • fYear
    1974
  • fDate
    10/1/1974 12:00:00 AM
  • Firstpage
    631
  • Lastpage
    636
  • Abstract
    An adjustable threshold MOS (Atmos) transistor is described that can be used as an electrically reprogrammable read-only memory by changing the charge content of a floating polysilicon gate. This floating gate is charged negatively (write) by means of a nonavalanche mechanism and charged positively (erase) by the avalanche breakdown of source or drain junction and subsequent hole injection into the oxide. The write time is between 10 and 100 ms, the erase time on the order of 1 s. The charge retention of the floating gate is about 90 percent after storage for 1000 h at 125°C.
  • Keywords
    Avalanche breakdown; Breakdown voltage; Charge carriers; Electron traps; Geometry; Helium; MOSFETs; Nonvolatile memory; P-n junctions; Silicon compounds;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1974.17981
  • Filename
    1477796