DocumentCode :
1048262
Title :
Atmos—An electrically reprogrammable read-only memory device
Author :
Verwey, Jan F. ; Kramer, Roel P.
Author_Institution :
Philips Research Laboratories, Eindhoven, The Netherlands
Volume :
21
Issue :
10
fYear :
1974
fDate :
10/1/1974 12:00:00 AM
Firstpage :
631
Lastpage :
636
Abstract :
An adjustable threshold MOS (Atmos) transistor is described that can be used as an electrically reprogrammable read-only memory by changing the charge content of a floating polysilicon gate. This floating gate is charged negatively (write) by means of a nonavalanche mechanism and charged positively (erase) by the avalanche breakdown of source or drain junction and subsequent hole injection into the oxide. The write time is between 10 and 100 ms, the erase time on the order of 1 s. The charge retention of the floating gate is about 90 percent after storage for 1000 h at 125°C.
Keywords :
Avalanche breakdown; Breakdown voltage; Charge carriers; Electron traps; Geometry; Helium; MOSFETs; Nonvolatile memory; P-n junctions; Silicon compounds;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1974.17981
Filename :
1477796
Link To Document :
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