DocumentCode
1048795
Title
High-Voltage SOI SJ-LDMOS With a Nondepletion Compensation Layer
Author
Wenlian Wang ; Zhang, Boming ; Li, Zuyi ; Chen, Weijie
Author_Institution
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu
Volume
30
Issue
1
fYear
2009
Firstpage
68
Lastpage
71
Abstract
A new superjunction LDMOS on silicon-on-insulator (SOI) with a nondepletion compensation layer (NDCL) is proposed. The NDCL can be self-adaptive to provide additional charges for compensating the charge imbalance while eliminating the substrate-assisted depletion effect. In addition, the high-density oxide interface charges at the top surface of the buried oxide layer (BOX) enhance the electric field in the BOX and improve the vertical breakdown voltage (BV). Numerical simulation results indicate that a uniform surface electric field profile is obtained and that the vertical electric field in BOX is increased to 6 times106 V/cm, which results in a high BV of 300 V for the proposed device with the BOX thickness of 0.5 mum and drift length of 15 mum on a thin SOI substrate.
Keywords
MIS devices; semiconductor device breakdown; silicon-on-insulator; breakdown voltage; buried oxide layer; high-density oxide interface; high-voltage SOI SJ-LDMOS; nondepletion compensation layer; silicon-on-insulator; size 0.5 mum; size 15 mum; substrate-assisted depletion effect; Breakdown voltage; Buffer layers; Dielectric devices; Dielectric substrates; Educational technology; Laboratories; Numerical simulation; Power integrated circuits; Silicon on insulator technology; Thin film devices; LDMOS; nondepletion compensation; substrate-assisted depletion effect; superjunction (SJ);
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2008.2008208
Filename
4729725
Link To Document