Title :
Realistic scalability of noise in dynamic circuits
Author :
Chowdhury, Masud H. ; Ismail, Yehea I.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Chicago, IL
fDate :
6/1/2006 12:00:00 AM
Abstract :
The usage of noise-sensitive dynamic circuits has become commonplace due to speed and area requirements, making the noise issue even more prominent. This paper focuses on the trends of coupling and its effects on dynamic circuits. It presents closed form analytical solutions for noise, as well as noise tolerance metrics for dynamic circuits. These solutions are within 5% of dynamic simulations. It is shown that not all scaling trends are negative for noise, and that the scaling down of supply voltage and increasing frequency, help improve certain aspects of the noise immunity of dynamic circuits. Most of the works treated the noise immunity and the noise content separately. This paper introduces an analysis of noise scalability by looking at the noise immunity and the noise content simultaneously
Keywords :
CMOS integrated circuits; integrated circuit noise; closed form analytical solutions; coupling noise; noise content; noise immunity; noise scalability; noise sensitive dynamic circuits; noise tolerance; CMOS logic circuits; CMOS technology; Capacitance; Circuit noise; Conductors; Coupling circuits; Nonhomogeneous media; Scalability; Semiconductor device noise; Threshold voltage; Coupling noise; dynamic circuits; noise content; noise immunity; noise scalability; noise tolerance;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2006.878221