DocumentCode
104888
Title
Electromagnetic Scattering From 3D Layered Structures With Randomly Rough Interfaces: Analysis With the Small Perturbation Method and the Small Slope Approximation
Author
Afifi, Saddek ; Dusseaux, Richard ; Berrouk, Abla
Author_Institution
Lab. de Phys. des Lasers, de Spectrosc. Opt. et d´Opto-Electron. (LAPLASO), Badji Mokhtar-Annaba Univ., Annaba, Algeria
Volume
62
Issue
10
fYear
2014
fDate
Oct. 2014
Firstpage
5200
Lastpage
5208
Abstract
We propose a theoretical study on the electromagnetic wave scattering from three-dimensional layered structures with an arbitrary number of rough interfaces by using the small perturbation method and the small slope approximation. The interfaces are characterized by Gaussian height distributions with zero mean values and Gaussian correlation functions. They can be correlated or not, isotropic or not. The electromagnetic field in each medium is represented by a continuum of plane waves and a perturbation theory is used for solving the boundary value problem and determining the first-order scattering amplitudes by recurrence relations. The scattering amplitudes under the first-order small slope approximation are deduced from results derived from the first-order small perturbation method. We analyze with the small slope approximation model the combined influence of the anisotropy and cross-correlation upon the electromagnetic signature of a natural stratified structure.
Keywords
Gaussian distribution; approximation theory; boundary-value problems; electromagnetic wave scattering; inhomogeneous media; perturbation techniques; 3D layered structures; Gaussian correlation functions; Gaussian height distributions; anisotropy; boundary value problem; cross-correlation; electromagnetic wave scattering; first-order scattering amplitudes; natural stratified structure; randomly rough interfaces; small perturbation method; small slope approximation; three-dimensional layered structures; Analytical models; Electromagnetic scattering; Perturbation methods; Rough surfaces; Surface roughness; Rough layered surfaces; scattering amplitudes; small perturbation method; small slope approximation;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/TAP.2014.2341704
Filename
6862023
Link To Document