Title :
Assembly of Copper Column Interconnect Flip Chip
Author :
Lin, Ta-Hsuan ; Menezes, Arun S. ; Andros, Frank ; McBride, Donald G. ; Lu, Susan ; Sammakia, Bahgat
Author_Institution :
Dept. of Syst. Sci. & Ind. Eng., New York State Univ., Binghamton, NY
fDate :
7/1/2007 12:00:00 AM
Abstract :
This paper addresses a new flip chip interconnection technology, flexible flip chip connection (F2C2) technology, for attaching silicon chips to a chip carrier using flexible copper wires. F2C2 is a novel approach to create area array flip chip interconnections using a matrix block of wires encapsulated with a heat-resistant, dissolvable substance. A slice from the wire matrix ingot is first attached to the chip using solder. The other end of the slice is then matched and soldered to the footprint of a substrate. Finally, the encapsulating, dissolvable substance is removed from the body of the slice, leaving the chip attached to the carrier by the inter- disposed, flexible copper wires. The compliant copper wire interconnections can accommodate the coefficient of thermal expansion (CTE) mismatch problem between die and substrate, thus eliminating the need for underfill.
Keywords :
copper; electronics packaging; flip-chip devices; interconnections; F2C2; array flip chip interconnections; coefficient of thermal expansion; copper column interconnect flip chip; dissolvable substance; flexible copper wires; flexible flip chip connection; heat-resistant; matrix block; silicon chips; Assembly; Capacitive sensors; Copper; Electronic packaging thermal management; Flip chip; Paper technology; Substrates; Thermal expansion; Thermal stresses; Wires; Copper; flip-chip; interconnection; packaging;
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
DOI :
10.1109/TEPM.2007.899149