DocumentCode :
1049101
Title :
Effect of carrier lifetime on mode partition noise in multimode semiconductor lasers
Author :
Wood-Hi Cheng
Author_Institution :
Tacan Corp., Carlsbad, CA, USA
Volume :
6
Issue :
3
fYear :
1994
fDate :
3/1/1994 12:00:00 AM
Firstpage :
355
Lastpage :
358
Abstract :
The dependence of mode partition noise (MPN), and its association with the eye diagram and power penalty, on carrier lifetime in 1.3 μm InGaAsP multimode semiconductor lasers for a 1.2 Gbit/s lightwave transmission system was investigated. It was found that lasers with shorter carrier lifetimes showed less MPN, and hence, a better eye opening and a lower power penalty, than the lasers with longer carrier lifetimes. The significant dependence of MPN, eye opening, and power penalty on carrier lifetime in multimode semiconductor lasers suggests that the carrier lifetime of the laser, which depends on the laser design, can be used as an important parameter for characterizing the performance of high-speed lightwave transmission systems.
Keywords :
III-V semiconductors; carrier lifetime; gallium arsenide; indium compounds; laser modes; optical communication equipment; semiconductor device noise; semiconductor lasers; 1.2 Gbit/s; 1.2 Gbit/s lightwave transmission system; 1.3 /spl mu/m InGaAsP multimode semiconductor lasers; 1.3 micron; InGaAsP; carrier lifetime; eye diagram; eye opening; laser design; mode partition noise; multimode semiconductor lasers; power penalty; Active noise reduction; Charge carrier lifetime; Fiber lasers; Laser modes; Laser noise; Lasers and electrooptics; Power lasers; Semiconductor device noise; Semiconductor lasers; System performance;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.275487
Filename :
275487
Link To Document :
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