DocumentCode :
1049376
Title :
Thin-film distributed RC parameter strain gauges
Author :
Stolinski, Edward J. ; Meiksin, Z.H.
Author_Institution :
Bettis Atomic Power Laboratory, West Mifflin, Pa.
Volume :
22
Issue :
3
fYear :
1975
fDate :
3/1/1975 12:00:00 AM
Firstpage :
102
Lastpage :
108
Abstract :
Thin-film cermet resistance strain gauges provide gauge factors of the order of 15, while providing higher stability than achievable with discontinuous thin-film metallic strain gauges. Strain-sensitive cermet resistors can be incorporated advantageously into thin-film distributed parameter notch filters. This results in a highly sensitive strain-sensing device which can be fabricated by a simple process germain to the thin-film microelectronic technology.
Keywords :
Capacitive sensors; Ceramics; Cleaning; Dielectrics; Filters; Helium; Resistors; Stability; Thin film circuits; Transistors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1975.18087
Filename :
1477922
Link To Document :
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