Title : 
Transfer inefficiency effects in parallel-transfer charge-coupled linear imaging devices
         
        
            Author : 
Hosack, H.H. ; Dyck, Rudolph H.
         
        
            Author_Institution : 
Fairchild Camera and Instrument Corporation, Palo Alto, Calif.
         
        
        
        
        
            fDate : 
3/1/1975 12:00:00 AM
         
        
        
        
            Abstract : 
This correspondence discusses the effects of transfer inefficiency on MTF (modulation transfer function) for single register readout and parallel-transfer readout of charge-coupled linear imaging devices. An analytical expression for transfer inefficiency effects on MTF for parallel-transfer arrays is derived. This expression is compared with the result for single register readout; and tile advantages of parallel-transfer readout are discussed.
         
        
            Keywords : 
Cameras; Charge coupled devices; Charge transfer; Current measurement; Degradation; Frequency; Instruments; Shift registers; Tiles; Transfer functions;
         
        
        
            Journal_Title : 
Electron Devices, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/T-ED.1975.18094