• DocumentCode
    1049753
  • Title

    The relationship of frequency of operation to large-signal noise degradation in IMPATT diodes

  • Author

    Sokolov, V. ; Beyer, J.B.

  • Author_Institution
    Northrop Corporation, Rolling Meadows, Ill.
  • Volume
    22
  • Issue
    5
  • fYear
    1975
  • fDate
    5/1/1975 12:00:00 AM
  • Firstpage
    297
  • Lastpage
    299
  • Abstract
    A singly tuned X-band IMPATT amplifier is simulated on a hybrid computer and results are given for the amount of conduction current modulation present in the device as a function of the period, T, with the ac voltage across the diode held fixed, Using Sjolund´s large-signal noise theory which relates the conduction current modulation to the noise measure, M, curves are presented showing a logarithmic relation between M and the period, T, with M increasing for larger T. An approximate theory is given to explain this behavior. These noise measure results are compared to the IMPATT power-output data to give a qualitative understanding of the rate of noise degradation with power output in relation to frequency of operation. It is shown that, for minimum noise degradation, the IMPATT should be operated at or above the frequency corresponding to maximum power output for a given ac voltage across the diode. This information can be used to establish a criterion for minimum noise degradation during intermediate and large signal operation.
  • Keywords
    Circuits; Clocks; Current measurement; Degradation; Diodes; Electrodes; Frequency; Logic arrays; Noise measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1975.18124
  • Filename
    1477959