Title : 
Capacitive probe measurements of dipole domains in InP
         
        
            Author : 
Robson, Peter N. ; Potter, Keith E. ; Majerfeld, Arnoldo
         
        
            Author_Institution : 
University of Sheffield, Sheffield, England
         
        
        
        
        
            fDate : 
8/1/1975 12:00:00 AM
         
        
        
        
            Abstract : 
The capacitive probe used in the past to study the behavior of high-field dipole domains in GaAs is analyzed in detail in order to assess the amount of signal distortion it produces when recording a moving surface potential variation. The results obtained are used to interpret dipole domain measurements in InP. A velocity-field curve for InP between 60 and 160 kV/cm is derived together with information on the variation of the domain shape, domain velocity, peak field, and depletion ratio for different excess domain voltages.
         
        
            Keywords : 
Capacitance; Distortion measurement; Earth; Gallium arsenide; Indium phosphide; Probes; Shape measurement; Signal analysis; Surface resistance; Voltage;
         
        
        
            Journal_Title : 
Electron Devices, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/T-ED.1975.18179