Application of elliptic Fourier descriptors to symmetry detection under parallel projection

Author

Yip, Raymond K K ; Tam, Peter K S ; Leung, Dennis N K

Author_Institution

Dept. of Electron. Eng., Hong Kong Polytech., Kowloon, Hong Kong

Volume

16

Issue

3

fYear

1994

fDate

3/1/1994 12:00:00 AM

Firstpage

277

Lastpage

286

Abstract

In this paper, the method of elliptic Fourier descriptors using arc length parameterization is applied to tackle the problem of detection and recovery of symmetry under parallel projection. A simple and fast iteration algorithm together with the invariants of symmetry provides sufficient information for the detection and recovery of symmetry under parallel projection. The proposed method has been extensively tested using symmetric figures under different parallel projections. Simulation results of the algorithm are presented. The extension of this method for planar object recognition under parallel projection is also addressed

Keywords

computer vision; invariance; iterative methods; series (mathematics); arc length parameterization; elliptic Fourier descriptors; invariants; iteration algorithm; parallel projection; planar object recognition; symmetry detection; Cameras; Computer vision; Fourier series; Nonlinear distortion; Object recognition; Pattern recognition; Shape measurement; Shearing; Testing; Transmission line matrix methods;

fLanguage

English

Journal_Title

Pattern Analysis and Machine Intelligence, IEEE Transactions on

Publisher

ieee

ISSN

0162-8828

Type

jour

DOI

10.1109/34.276127

Filename

276127