DocumentCode
105070
Title
BLAST: B-LAyered bad-character SHIFT tables for high-speed pattern matching
Author
Yoon-Ho Choi ; Seung-Woo Seo
Author_Institution
Dept. of Convergence Security, Kyonggi Univ., Suwon, South Korea
Volume
7
Issue
3
fYear
2013
fDate
Sept. 2013
Firstpage
195
Lastpage
202
Abstract
In this study, the authors propose a new multi-pattern matching algorithm, called BLAST (B-LAyered bad-character Shift Tables with a single-byte search unit), which considers space-time tradeoff in the context of shift values during the search. Here, the term `bad character´ is a character that causes a mismatch. While checking multiple bytes in scanning the text at a time, the BLAST algorithm overcomes the reduction of the average shift value in a typical search, which is caused by the dependency on the multi-byte search unit (MBSU) and the large frequency of the last character of the given patterns. From the theoretical analysis, the authors validate the correctness of the BLAST algorithm. Also, from the experimental results across different setups, the authors show that the BLAST algorithm provides the faster search time than the other algorithms. For example, the authors obtain an enhancement by as much as 212.41% on average for various numbers of attack patterns and attack traffic conditions compared with that of the modified Wu-Manber algorithm. In addition, it is shown that the BLAST algorithm drastically reduces the amount of memory required for constructing the shift table based on a MBSU from 64 KB to 1 KB.
Keywords
computer network security; search problems; string matching; text analysis; B-layered bad-character SHIFT tables; BLAST algorithm; MBSU; Wu-Manber algorithm; attack patterns; attack traffic conditions; byte checking; high-speed pattern matching; multibyte search unit; multipattern matching algorithm; pattern search time; shift values; single bad-character SHIFT table; single-byte search unit; space-time tradeoff; text scanning;
fLanguage
English
Journal_Title
Information Security, IET
Publisher
iet
ISSN
1751-8709
Type
jour
DOI
10.1049/iet-ifs.2011.0305
Filename
6587875
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