• DocumentCode
    1050880
  • Title

    Node and mesh analysis by inspection

  • Author

    Gottling, James G.

  • Author_Institution
    Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
  • Volume
    38
  • Issue
    4
  • fYear
    1995
  • fDate
    11/1/1995 12:00:00 AM
  • Firstpage
    312
  • Lastpage
    316
  • Abstract
    This paper shows how to write node or mesh analysis linear circuit equations by inspection of the circuit schematic diagram and obtains two different matrix solutions of these equations. The linear circuit can have resistances or impedances, controlled sources, ideal operational amplifiers, or mutually coupled coils. The first matrix solution finds the node-voltage or mesh-current vector in terms of matrix operations with the inspection matrices. Also, this method gives a matrix solution for any arbitrary output vector in terms of the node-voltage or mesh-current solution vector, the independent-source vector, and the inspection matrices. The second matrix solution method finds the solution for a vector consisting of all node voltages or mesh currents, dependent sources, controlling variables, and any output variable(s) using a single matrix equation. Matrix methods of circuit analysis are now appropriate for student use because of the existence of calculators capable of solving large matrices and the availability of inexpensive math programs for personal computers
  • Keywords
    electrical engineering education; linear network analysis; matrix algebra; controlled sources; ideal operational amplifiers; impedances; inspection; linear circuit equations; math programs; matrix operations; matrix solutions; mesh analysis; mesh currents; mutually coupled coils; node analysis; node voltages; personal computers; resistances; students; Circuit analysis; Coils; Coupling circuits; Differential equations; Impedance; Inspection; Linear circuits; Mutual coupling; Operational amplifiers; Vectors;
  • fLanguage
    English
  • Journal_Title
    Education, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9359
  • Type

    jour

  • DOI
    10.1109/13.473148
  • Filename
    473148