• DocumentCode
    1051125
  • Title

    Noise in MOS bucket-brigade devices

  • Author

    Buss, Dennis D. ; Bailey, Walter H. ; Eversole, William L.

  • Author_Institution
    Texas Instruments, Incorporated, Dallas, Tex.
  • Volume
    22
  • Issue
    11
  • fYear
    1975
  • fDate
    11/1/1975 12:00:00 AM
  • Firstpage
    977
  • Lastpage
    981
  • Abstract
    Previous calculations of noise in bucket-brigade devices (BBD´s) have ignored subthreshold leakage current even though BBD´s operate in the subthreshold region over most of their useful frequency range. In this work, subthreshold leakage is included in the calculation, but surprisingly, it makes little difference in the end result. The noise spectrum in p-channel BBD´s is measured and agrees well with the calculated noise spectrum which includes the effects of correlation between noise packets, imperfect charge transfer efficiency, and output circuitry.
  • Keywords
    Charge transfer; Circuit noise; Clocks; Density measurement; Equations; Frequency; Low-frequency noise; MOSFET circuits; Noise measurement; Subthreshold current;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1975.18256
  • Filename
    1478091