• DocumentCode
    1051219
  • Title

    An effective approach for study of multiple discontinuities of transmission lines

  • Author

    Xu, Yansheng ; Bosisio, Renato G.

  • Author_Institution
    Dept. de Genie Electr. et Genie Inf., Ecole Polytech. de Montreal, Que., Canada
  • Volume
    43
  • Issue
    11
  • fYear
    1995
  • fDate
    11/1/1995 12:00:00 AM
  • Firstpage
    2585
  • Lastpage
    2589
  • Abstract
    In this paper, a novel approach for calculation of discontinuities of transmission lines is presented. This approach is flexible, simple and effective. For calculation of multiple discontinuities or to take into account the thickness of the obstacles, it is only necessary to transfer the relationship between the electric and magnetic field components from one discontinuity to another and match them on the last one. The method of transfer may be arbitrary, it may also be realized by using the well-known method of lines or others methods, Both single and multiple waveguide discontinuities are calculated and the computed results are in good agreement with the literature. Examples of finite thickness waveguide discontinuities are also given. The proposed method may be readily used to calculate microstrip discontinuities. Extension to discontinuities of other types of transmission lines can also be performed
  • Keywords
    microstrip discontinuities; rectangular waveguides; transmission line theory; waveguide discontinuities; electric field components; magnetic field components; method of lines; microstrip discontinuities; multiple discontinuities; multiple waveguide discontinuities; obstacle thickness; parallel plate waveguide; rectangular waveguide; single waveguide discontinuities; transmission lines; Equations; Magnetic fields; Microstrip; Planar waveguides; Shape; Transmission line discontinuities; Transmission line theory; Transmission lines; Waveguide discontinuities;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.473182
  • Filename
    473182