DocumentCode
1051274
Title
Autoprobe testing for emitter—Collector spikes in microwave bipolar transistors
Author
Tausch, Jake
Author_Institution
Tektronix, Inc., Beaverton, Ore.
Volume
22
Issue
11
fYear
1975
fDate
11/1/1975 12:00:00 AM
Firstpage
1052
Lastpage
1053
Abstract
Direct-current characteristics of microwave bipolar transistors with emitter-collector spikes are examined. Measured data from a large sample of spiked transistors are evaluated and related to the FET model of a spike. A suitable test for spiking is developed for use in a dc autoprobe program. Typical results from a wafer are presented.
Keywords
Automatic testing; Bipolar transistors; Electrical resistance measurement; Integrated circuit testing; Microwave FETs; Microwave transistors; Scattering; Semiconductor device modeling; System testing; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1975.18271
Filename
1478106
Link To Document