DocumentCode :
1051308
Title :
Fail-safe element using thin film parametron
Author :
Ito, Noboru
Author_Institution :
Oi Electric Company, Ltd., Yokohama, Japan
Volume :
8
Issue :
3
fYear :
1972
fDate :
9/1/1972 12:00:00 AM
Firstpage :
361
Lastpage :
361
Abstract :
In addition to a memory apparatus, one of the applications of thin Permalloy wires is a fail-safe element using a thin film parametron (T.F.P.). "Parametron" has been known as the failsafe element in automatic control fields. The T.F.P. is more suitable to the fail-safe element than a ferrite one with regard to speed, stability, and size. Thin Permalloy wires used are 81 Ni-Fe alloy with a thickness of 1 μm electrodeposited onto copper wires with a diameter of 0.47 mm. The uniaxial field-induced anisotropy was in the peripheral direction, and the anisotropy field was about 200 At/m. Output voltages of the T.F.P. are more stabilized than those of a ferrite parametron. This is one of the reasons why the T.F.P. is recommended as a fail-safe element. A test set with a twin binary counter of seventeen digits using about 300 T.F.P. fail-safe elements has been operated satisfactorily with an exciting current of 0.2 A rms and 50 kHz clock.
Keywords :
Parametrons; Permalloy films/devices; Anisotropic magnetoresistance; Automatic control; Copper alloys; Counting circuits; Ferrites; Stability; Testing; Transistors; Voltage; Wires;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1972.1067505
Filename :
1067505
Link To Document :
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