I-5 the relationship between surface and bulk defects in DH LPE GaAs/AlxGa1-xAs wafers
Author :
Blakeslee, A.E. ; Shih, K.K.
Volume :
22
Issue :
11
fYear :
1975
Firstpage :
1055
Lastpage :
1055
Abstract :
Summary form only. An abstract of the above-titled article taken from the Device Research Conference (24-26 June 1975, Carleton University, Ottawa, Ont., Canada) is presented.
