Title :
IIB-1 noise measurements on buried-channel charge-coupled devices
Author :
Brodersen, R.W. ; Emmons, Stephen P.
Author_Institution :
Texas Instruments Incorporated, Dallas, Tex
Abstract :
Summary form only. An abstract of the above-titled article taken from the Device Research Conference (24-26 June 1975, Carleton University, Ottawa, Ont., Canada) is presented.
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1975.18283
