• DocumentCode
    1051403
  • Title

    A New Method for RTS Noise of Semiconductor Devices Identification

  • Author

    Konczakowska, Alicja ; Cichosz, Jacek ; Szewczyk, Arkadiusz

  • Author_Institution
    Gdansk Univ. of Technol., Gdansk
  • Volume
    57
  • Issue
    6
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    1199
  • Lastpage
    1206
  • Abstract
    In this paper, a new method, called the noise scattering pattern method (NSP method), for random telegraph signal noise identification in the inherent noise of semiconductor devices is described. A block diagram of a noise measurement system based on the NSP method is presented. Examples of patterns of the NSP method are included.
  • Keywords
    burst noise; noise measurement; semiconductor device noise; RTS noise; noise scattering pattern method; random telegraph signal noise identification; semiconductor devices; Noise scattering pattern method (NSP method); random telegraph signal (RTS) noise; semiconductor devices;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2007.915098
  • Filename
    4443224
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1051403