Title :
IIB-2 a new method to measure very low bulk trap densities in silicon
Author_Institution :
Philips Research Laboratories, Eindhoven, The Netherlands
Abstract :
Summary form only. An abstract of the above-titled article taken from the Device Research Conference (24-26 June 1975, Carleton University, Ottawa, Ont., Canada) is presented.
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1975.18287
