Title :
IIB-7 electron bombarded silicon performance of CCD imagers
Author :
Roberts, C.G. ; Robinson, D.A. ; Barton ; Collins, D.R.
Author_Institution :
Texas Instruments Inc., Dallas, Tex
Abstract :
Summary form only. An abstract of the above-titled article taken from the Device Research Conference (24-26 June 1975, Carleton University, Ottawa, Ont., Canada) is presented.
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1975.18292
