• DocumentCode
    1051491
  • Title

    Extended cavity perturbation technique to determine the complex permittivity of dielectric materials

  • Author

    Meng, Binshen ; Booske, John ; Cooper, Reid

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
  • Volume
    43
  • Issue
    11
  • fYear
    1995
  • fDate
    11/1/1995 12:00:00 AM
  • Firstpage
    2633
  • Lastpage
    2636
  • Abstract
    An improved measurement technique to determine the complex dielectric properties of materials has been developed that extends the validity of the conventional cavity perturbation technique for circular cylindrical rod-shaped samples in circular cylindrical cavities resonating in TM0n0 modes. The method is particularly useful for the dielectric characterization of fragile, low-loss materials that are difficult to machine to typically required thin dimensions. The method further allows for multi-frequency measurements using higher-order radial modes and somewhat alleviates the very small cavity dimensions typically required by the conventional perturbation technique at higher microwave frequencies. A validity criterion for the extended method is given. Measurements of the complex permittivity of NaCl single crystals are presented, showing excellent agreement with theory
  • Keywords
    cavity resonators; microwave measurement; permittivity measurement; perturbation techniques; NaCl; NaCl single crystals; cavity perturbation technique; circular cylindrical cavity resonators; circular cylindrical rod-shaped samples; complex permittivity; dielectric materials; fragile low-loss materials; microwave frequencies; multi-frequency measurements; Crystals; Dielectric devices; Dielectric materials; Dielectric measurements; Frequency measurement; Measurement techniques; Microwave frequencies; Microwave measurements; Permittivity measurement; Perturbation methods;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.473190
  • Filename
    473190